Stress-Driven Migration of Low-Angle Grain Boundaries Near Crack Tips in Nanocomposites Containing Incoherent Nanoinclusions

Stress-Driven Migration of Low-Angle Grain Boundaries Near Crack Tips in Nanocomposites Containing Incoherent Nanoinclusions

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Theoretical model Resistance Cable describing stress-driven migration of low-angle grain boundaries (GBs) in the vicinity of growing crack in metal matrix nanocomposites with reinforcing (metallic or ceramic) incoherent nanoinclusions is proposed.Using two-dimensional discrete dislocation dynamics approach profiles of migrating GBs are analytically calculated and critical stress for transition into Blood Pressure - Blood Pressure Cuffs unstable migration mode is found.It is shown that the presence of crack always promotes stress-driven migration and thus grain growth.